Reliability Modeling of Mutual DCFP Considering Failure Physical Dependency

Degradation and overstress failures occur in many electronic systems which the operation load environmental conditions are complex. The dependency of them called dependent competing failure process (DCFP), has been widely studied. Electronic system may experience mutual effects degradation shocks, they considered to be interdependent. Both shock processes will decrease limit cause cumulative effect. Finally, competition hard soft failure. Based on mechanism accumulation theory, this paper constructs shock-degradation acceleration threshold descent model, a reliability model established by using these two models. mutually DCFP effect interaction decomposed into physical correlation failure, including acceleration, competition. As case, aeronautical analyzed with proposed method. method is based evaluation, could provide important reference for quantitative evaluation design improvement newly designed case data deficiency.